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X-ray nano-tomography of complete scales from the ultra-white beetles Lepidiota stigma and Cyphochilus
High resolution X-ray nano-tomography experiments are often limited to a few tens of micrometer size volumes due to detector size. It is possible, through the use of multiple overlapping tomography scans, to produce a large area scan which can encompass a sample in its entirety. Mounting and positio...
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| Опубликовано в: : | Sci Data |
|---|---|
| Главные авторы: | , , , , , , , , , , |
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
Nature Publishing Group UK
2020
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| Предметы: | |
| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7260169/ https://ncbi.nlm.nih.gov/pubmed/32472045 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41597-020-0502-y |
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