X-ray nano-tomography of complete scales from the ultra-white beetles Lepidiota stigma and Cyphochilus

High resolution X-ray nano-tomography experiments are often limited to a few tens of micrometer size volumes due to detector size. It is possible, through the use of multiple overlapping tomography scans, to produce a large area scan which can encompass a sample in its entirety. Mounting and positio...

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Detalhes bibliográficos
Publicado no:Sci Data
Main Authors: Burg, Stephanie L., Washington, Adam L., Villanova, Julie, Dennison, Andrew J. C., McLoughlin, Daragh, Mykhaylyk, Oleksandr O., Vukusic, Pete, Furnass, Will, Jones, Richard A. L., Parnell, Andrew J., Fairclough, J. Patrick A.
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2020
Assuntos:
Data Descriptor
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7260169/
https://ncbi.nlm.nih.gov/pubmed/32472045
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41597-020-0502-y
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