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A Simple High-Resolution Near-Field Probe for Microwave Non-Destructive Test and Imaging
Non-destructive tests working at lower microwave frequencies have large advantages of dielectric material penetrability, lower equipment cost, and lower implementation complexity. However, the resolution will become worse as the work frequencies become lower. Relying on designing the structure of hi...
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| 出版年: | Sensors (Basel) |
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| 主要な著者: | , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI
2020
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7249217/ https://ncbi.nlm.nih.gov/pubmed/32392850 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s20092670 |
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