Chargement en cours...
In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter
In this paper, for the first time it is shown how in-line holography in Transmission Electron Microscopy (TEM) enables the study of radiation-sensitive nanoparticles of organic and inorganic materials providing high-contrast holograms of single nanoparticles, while illuminating specimens with a dens...
Enregistré dans:
| Publié dans: | Materials (Basel) |
|---|---|
| Auteur principal: | |
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
MDPI
2020
|
| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7142924/ https://ncbi.nlm.nih.gov/pubmed/32245011 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma13061413 |
| Tags: |
Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!
|