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In-line three-dimensional holography of nanocrystalline objects at atomic resolution
Resolution and sensitivity of the latest generation aberration-corrected transmission electron microscopes allow the vast majority of single atoms to be imaged with sub-Ångstrom resolution and their locations determined in an image plane with a precision that exceeds the 1.9-pm wavelength of 300 kV...
Gorde:
| Argitaratua izan da: | Nat Commun |
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| Egile Nagusiak: | , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Nature Publishing Group
2016
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4759637/ https://ncbi.nlm.nih.gov/pubmed/26887849 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/ncomms10603 |
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