Assessing radiation dose limits for X-ray fluorescence microscopy analysis of plant specimens

BACKGROUND AND AIMS: X-ray fluorescence microscopy (XFM) is a powerful technique to elucidate the distribution of elements within plants. However, accumulated radiation exposure during analysis can lead to structural damage and experimental artefacts including elemental redistribution. To date, acce...

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Bibliografische gegevens
Gepubliceerd in:Ann Bot
Hoofdauteurs: Jones, Michael W M, Kopittke, Peter M, Casey, Lachlan, Reinhardt, Juliane, Blamey, F Pax C, van der Ent, Antony
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: Oxford University Press 2020
Onderwerpen:
Technical Article
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC7102987/
https://ncbi.nlm.nih.gov/pubmed/31777920
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/aob/mcz195
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