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Assessing radiation dose limits for X-ray fluorescence microscopy analysis of plant specimens
BACKGROUND AND AIMS: X-ray fluorescence microscopy (XFM) is a powerful technique to elucidate the distribution of elements within plants. However, accumulated radiation exposure during analysis can lead to structural damage and experimental artefacts including elemental redistribution. To date, acce...
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| Publicat a: | Ann Bot |
|---|---|
| Autors principals: | , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Oxford University Press
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7102987/ https://ncbi.nlm.nih.gov/pubmed/31777920 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/aob/mcz195 |
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