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Radiation dose optimized lateral expansion of the field of view in synchrotron radiation X-ray tomographic microscopy

Volumetric data at micrometer level resolution can be acquired within a few minutes using synchrotron-radiation-based tomographic microscopy. The field of view along the rotation axis of the sample can easily be increased by stacking several tomograms, allowing the investigation of long and thin obj...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Haberthür, David, Hintermüller, Christoph, Marone, Federica, Schittny, Johannes C., Stampanoni, Marco
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: International Union of Crystallography 2010
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC2927902/
https://ncbi.nlm.nih.gov/pubmed/20724780
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049510019618
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