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Radiation dose optimized lateral expansion of the field of view in synchrotron radiation X-ray tomographic microscopy
Volumetric data at micrometer level resolution can be acquired within a few minutes using synchrotron-radiation-based tomographic microscopy. The field of view along the rotation axis of the sample can easily be increased by stacking several tomograms, allowing the investigation of long and thin obj...
Tallennettuna:
| Päätekijät: | , , , , |
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| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
International Union of Crystallography
2010
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2927902/ https://ncbi.nlm.nih.gov/pubmed/20724780 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049510019618 |
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