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The Application of Chemical Polishing in TEM Sample Preparation of Zirconium Alloys
Hydride artefacts are commonly induced by the TEM sample preparation process in Zirconium alloys as hydrogen-sensitive metals, including electron polishing and focused ion beam (FIB) technology. In the research, we present the application of chemical polishing with a solution of 10HF:45HNO(3):45H(2)...
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| Pubblicato in: | Materials (Basel) |
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| Autori principali: | , , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
MDPI
2020
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7084560/ https://ncbi.nlm.nih.gov/pubmed/32106508 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma13051036 |
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