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25(th) Anniversary of STED Microscopy and the 20(th) Anniversary of SIM: feature introduction

This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emi...

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Bibliografiske detaljer
Udgivet i:Biomed Opt Express
Main Authors: Kner, Peter, Manley, Suliana, Shechtman, Yoav, Stallinga, Sjoerd
Format: Artigo
Sprog:Inglês
Udgivet: Optical Society of America 2020
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC7075616/
https://ncbi.nlm.nih.gov/pubmed/32206437
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/BOE.391490
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