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25(th) Anniversary of STED Microscopy and the 20(th) Anniversary of SIM: feature introduction
This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emi...
Gorde:
| Argitaratua izan da: | Biomed Opt Express |
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| Egile Nagusiak: | , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Optical Society of America
2020
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7075616/ https://ncbi.nlm.nih.gov/pubmed/32206437 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/BOE.391490 |
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