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25(th) Anniversary of STED Microscopy and the 20(th) Anniversary of SIM: feature introduction

This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emi...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Argitaratua izan da:Biomed Opt Express
Egile Nagusiak: Kner, Peter, Manley, Suliana, Shechtman, Yoav, Stallinga, Sjoerd
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Optical Society of America 2020
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC7075616/
https://ncbi.nlm.nih.gov/pubmed/32206437
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/BOE.391490
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