טוען...
X-ray free-electron laser wavefront sensing using the fractional Talbot effect
Wavefront sensing at X-ray free-electron lasers is important for quantitatively understanding the fundamental properties of the laser, for aligning X-ray instruments and for conducting scientific experimental analysis. A fractional Talbot wavefront sensor has been developed. This wavefront sensor en...
שמור ב:
| הוצא לאור ב: | J Synchrotron Radiat |
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| Main Authors: | , , , , , , , , , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
International Union of Crystallography
2020
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7064100/ https://ncbi.nlm.nih.gov/pubmed/32153264 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577519017107 |
| תגים: |
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