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Nanoelectromechanical relay without pull-in instability for high-temperature non-volatile memory

Emerging applications such as the Internet-of-Things and more-electric aircraft require electronics with integrated data storage that can operate in extreme temperatures with high energy efficiency. As transistor leakage current increases with temperature, nanoelectromechanical relays have emerged a...

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書目詳細資料
發表在:Nat Commun
Main Authors: Rana, Sunil, Mouro, João, Bleiker, Simon J., Reynolds, Jamie D., Chong, Harold M. H., Niklaus, Frank, Pamunuwa, Dinesh
格式: Artigo
語言:Inglês
出版: Nature Publishing Group UK 2020
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在線閱讀:https://ncbi.nlm.nih.gov/pmc/articles/PMC7055292/
https://ncbi.nlm.nih.gov/pubmed/32132542
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-020-14872-2
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