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Nanoelectromechanical relay without pull-in instability for high-temperature non-volatile memory

Emerging applications such as the Internet-of-Things and more-electric aircraft require electronics with integrated data storage that can operate in extreme temperatures with high energy efficiency. As transistor leakage current increases with temperature, nanoelectromechanical relays have emerged a...

Täydet tiedot

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Bibliografiset tiedot
Julkaisussa:Nat Commun
Päätekijät: Rana, Sunil, Mouro, João, Bleiker, Simon J., Reynolds, Jamie D., Chong, Harold M. H., Niklaus, Frank, Pamunuwa, Dinesh
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Nature Publishing Group UK 2020
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC7055292/
https://ncbi.nlm.nih.gov/pubmed/32132542
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-020-14872-2
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