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Nanoelectromechanical relay without pull-in instability for high-temperature non-volatile memory
Emerging applications such as the Internet-of-Things and more-electric aircraft require electronics with integrated data storage that can operate in extreme temperatures with high energy efficiency. As transistor leakage current increases with temperature, nanoelectromechanical relays have emerged a...
Tallennettuna:
| Julkaisussa: | Nat Commun |
|---|---|
| Päätekijät: | , , , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Nature Publishing Group UK
2020
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7055292/ https://ncbi.nlm.nih.gov/pubmed/32132542 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-020-14872-2 |
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