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Process Optimization of Via Plug Multilevel Interconnections in CMOS Logic Devices

This paper reports on the optimization of the device and wiring in a via structure applied to multilevel metallization (MLM) used in CMOS logic devices. A MLM via can be applied to the Tungsten (W) plug process of the logic device by following the most optimized barrier deposition scheme of RF etchi...

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Detalhes bibliográficos
Publicado no:Micromachines (Basel)
Main Authors: Cui, Yinhua, Jeong, Jeong Yeul, Gao, Yuan, Pyo, Sung Gyu
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2019
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7019522/
https://ncbi.nlm.nih.gov/pubmed/31881782
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/mi11010032
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