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NanoThermoMechanical AND and OR Logic Gates
Today’s electronics cannot perform in harsh environments (e.g., elevated temperatures and ionizing radiation environments) found in many engineering applications. Based on the coupling between near-field thermal radiation and MEMS thermal actuation, we presented the design and modeling of NanoThermo...
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| 出版年: | Sci Rep |
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| 主要な著者: | , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group UK
2020
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7016178/ https://ncbi.nlm.nih.gov/pubmed/32051452 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-59181-2 |
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