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NanoThermoMechanical AND and OR Logic Gates
Today’s electronics cannot perform in harsh environments (e.g., elevated temperatures and ionizing radiation environments) found in many engineering applications. Based on the coupling between near-field thermal radiation and MEMS thermal actuation, we presented the design and modeling of NanoThermo...
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| Publié dans: | Sci Rep |
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| Auteurs principaux: | , |
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
Nature Publishing Group UK
2020
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7016178/ https://ncbi.nlm.nih.gov/pubmed/32051452 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-59181-2 |
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