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An interactive ImageJ plugin for semi-automated image denoising in electron microscopy

The recent advent of 3D in electron microscopy (EM) has allowed for detection of nanometer resolution structures. This has caused an explosion in dataset size, necessitating the development of automated workflows. Moreover, large 3D EM datasets typically require hours to days to be acquired and acce...

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Bibliografische gegevens
Gepubliceerd in:Nat Commun
Hoofdauteurs: Roels, Joris, Vernaillen, Frank, Kremer, Anna, Gonçalves, Amanda, Aelterman, Jan, Luong, Hiêp Q., Goossens, Bart, Philips, Wilfried, Lippens, Saskia, Saeys, Yvan
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: Nature Publishing Group UK 2020
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC7005902/
https://ncbi.nlm.nih.gov/pubmed/32034132
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-020-14529-0
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