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An interactive ImageJ plugin for semi-automated image denoising in electron microscopy

The recent advent of 3D in electron microscopy (EM) has allowed for detection of nanometer resolution structures. This has caused an explosion in dataset size, necessitating the development of automated workflows. Moreover, large 3D EM datasets typically require hours to days to be acquired and acce...

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Detalhes bibliográficos
Publicado no:Nat Commun
Main Authors: Roels, Joris, Vernaillen, Frank, Kremer, Anna, Gonçalves, Amanda, Aelterman, Jan, Luong, Hiêp Q., Goossens, Bart, Philips, Wilfried, Lippens, Saskia, Saeys, Yvan
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2020
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7005902/
https://ncbi.nlm.nih.gov/pubmed/32034132
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-020-14529-0
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