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An interactive ImageJ plugin for semi-automated image denoising in electron microscopy

The recent advent of 3D in electron microscopy (EM) has allowed for detection of nanometer resolution structures. This has caused an explosion in dataset size, necessitating the development of automated workflows. Moreover, large 3D EM datasets typically require hours to days to be acquired and acce...

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Detaylı Bibliyografya
Yayımlandı:Nat Commun
Asıl Yazarlar: Roels, Joris, Vernaillen, Frank, Kremer, Anna, Gonçalves, Amanda, Aelterman, Jan, Luong, Hiêp Q., Goossens, Bart, Philips, Wilfried, Lippens, Saskia, Saeys, Yvan
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Nature Publishing Group UK 2020
Konular:
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC7005902/
https://ncbi.nlm.nih.gov/pubmed/32034132
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-020-14529-0
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