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Effects of growth technique on the microstructure of CuInSe(2) ternary semiconductor compound
X-ray diffraction (XRD) and Energy-dispersive X-ray fluorescence spectrometer (EDXRF) are employed to investigate the microstructure of bulk [Formula: see text] specimens grown through the Bridgman technique and traveling heater process, respectively. We investigate the lattice parameters, grain siz...
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| Udgivet i: | Heliyon |
|---|---|
| Main Authors: | , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Elsevier
2020
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6974771/ https://ncbi.nlm.nih.gov/pubmed/31993518 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.heliyon.2020.e03196 |
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