Cryo-focused ion beam preparation of perovskite based solar cells for atom probe tomography

Focused-ion beam lift-out and annular milling is the most common method used for obtaining site specific specimens for atom probe tomography (APT) experiments and transmission electron microscopy. However, one of the main limitations of this technique comes from the structural damage as well as chem...

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Dades bibliogràfiques
Publicat a:PLoS One
Autors principals: Rivas, Nicolás Alfonso, Babayigit, Aslihan, Conings, Bert, Schwarz, Torsten, Sturm, Andreas, Garzón Manjón, Alba, Cojocaru-Mirédin, Oana, Gault, Baptiste, Renner, Frank Uwe
Format: Artigo
Idioma:Inglês
Publicat: Public Library of Science 2020
Matèries:
Research Article
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC6964857/
https://ncbi.nlm.nih.gov/pubmed/31945119
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0227920
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