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Cryo-focused ion beam preparation of perovskite based solar cells for atom probe tomography
Focused-ion beam lift-out and annular milling is the most common method used for obtaining site specific specimens for atom probe tomography (APT) experiments and transmission electron microscopy. However, one of the main limitations of this technique comes from the structural damage as well as chem...
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| Publicado no: | PLoS One |
|---|---|
| Main Authors: | , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Public Library of Science
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6964857/ https://ncbi.nlm.nih.gov/pubmed/31945119 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0227920 |
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