Atom Probe Tomography Studies on the Cu(In,Ga)Se(2) Grain Boundaries

Compared with the existent techniques, atom probe tomography is a unique technique able to chemically characterize the internal interfaces at the nanoscale and in three dimensions. Indeed, APT possesses high sensitivity (in the order of ppm) and high spatial resolution (sub nm). Considerable efforts...

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Kaydedildi:
Detaylı Bibliyografya
Asıl Yazarlar: Cojocaru-Mirédin, Oana, Schwarz, Torsten, Choi, Pyuck-Pa, Herbig, Michael, Wuerz, Roland, Raabe, Dierk
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: MyJove Corporation 2013
Konular:
Physics
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC3667468/
https://ncbi.nlm.nih.gov/pubmed/23629452
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3791/50376
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