Refinement for single-nanoparticle structure determination from low-quality single-shot coherent diffraction data

With the emergence of X-ray free-electron lasers, it is possible to investigate the structure of nanoscale samples by employing coherent diffractive imaging in the X-ray spectral regime. In this work, we developed a refinement method for structure reconstruction applicable to low-quality coherent di...

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Αποθηκεύτηκε σε:
Λεπτομέρειες βιβλιογραφικής εγγραφής
Τόπος έκδοσης:IUCrJ
Κύριοι συγγραφείς: Nishiyama, Toshiyuki, Niozu, Akinobu, Bostedt, Christoph, Ferguson, Ken R., Sato, Yuhiro, Hutchison, Christopher, Nagaya, Kiyonobu, Fukuzawa, Hironobu, Motomura, Koji, Wada, Shin-ichi, Sakai, Tsukasa, Matsunami, Kenji, Matsuda, Kazuhiro, Tachibana, Tetsuya, Ito, Yuta, Xu, Weiqing, Mondal, Subhendu, Umemoto, Takayuki, Nicolas, Christophe, Miron, Catalin, Kameshima, Takashi, Joti, Yasumasa, Tono, Kensuke, Hatsui, Takaki, Yabashi, Makina, Ueda, Kiyoshi
Μορφή: Artigo
Γλώσσα:Inglês
Έκδοση: International Union of Crystallography 2020
Θέματα:
Research Papers
Διαθέσιμο Online:https://ncbi.nlm.nih.gov/pmc/articles/PMC6949595/
https://ncbi.nlm.nih.gov/pubmed/31949900
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252519014222
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