Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays

Characterizing and controlling the uniformity of nanoparticles is crucial for their application in science and technology because crystalline defects in the nanoparticles strongly affect their unique properties. Recently, ultra-short and ultra-bright X-ray pulses provided by X-ray free-electron lase...

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Publicat a:IUCrJ
Autors principals: Niozu, Akinobu, Kumagai, Yoshiaki, Nishiyama, Toshiyuki, Fukuzawa, Hironobu, Motomura, Koji, Bucher, Maximilian, Asa, Kazuki, Sato, Yuhiro, Ito, Yuta, Takanashi, Tsukasa, You, Daehyun, Ono, Taishi, Li, Yiwen, Kukk, Edwin, Miron, Catalin, Neagu, Liviu, Callegari, Carlo, Di Fraia, Michele, Rossi, Giorgio, Galli, Davide E., Pincelli, Tommaso, Colombo, Alessandro, Owada, Shigeki, Tono, Kensuke, Kameshima, Takashi, Joti, Yasumasa, Katayama, Tetsuo, Togashi, Tadashi, Yabashi, Makina, Matsuda, Kazuhiro, Nagaya, Kiyonobu, Bostedt, Christoph, Ueda, Kiyoshi
Format: Artigo
Idioma:Inglês
Publicat: International Union of Crystallography 2020
Matèries:
Research Papers
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC7055387/
https://ncbi.nlm.nih.gov/pubmed/32148855
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S205225252000144X
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