Caricamento...
White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window
Collecting back-scattered X-rays from vacuum windows using a pinhole X-ray camera provides an efficient and reliable method of measuring the beam shape and position of the white synchrotron beam. In this paper, measurements are presented that were conducted at ESRF beamline ID6 which uses an in-vacu...
Salvato in:
| Pubblicato in: | J Synchrotron Radiat |
|---|---|
| Autori principali: | , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
International Union of Crystallography
2020
|
| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6927516/ https://ncbi.nlm.nih.gov/pubmed/31868734 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577519015340 |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne! !
|