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White beam diagnostics using X-ray back-scattering from a CVD diamond vacuum window

Collecting back-scattered X-rays from vacuum windows using a pinhole X-ray camera provides an efficient and reliable method of measuring the beam shape and position of the white synchrotron beam. In this paper, measurements are presented that were conducted at ESRF beamline ID6 which uses an in-vacu...

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Detalhes bibliográficos
Publicado no:J Synchrotron Radiat
Main Authors: van Silfhout, Roelof, Pothin, Daniel, Martin, Thierry
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2020
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6927516/
https://ncbi.nlm.nih.gov/pubmed/31868734
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577519015340
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