טוען...
In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector
Results of studies on micro-focused X-ray beam diagnostics using an X-ray beam imaging (XBI) instrument based on the idea of recording radiation scattered from a thin foil of a low-Z material with a lensless camera are reported. The XBI instrument captures magnified images of the scattering region w...
שמור ב:
| Main Authors: | , , |
|---|---|
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
International Union of Crystallography
2014
|
| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3945420/ https://ncbi.nlm.nih.gov/pubmed/24562554 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577513034759 |
| תגים: |
הוספת תג
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
|