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In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector

Results of studies on micro-focused X-ray beam diagnostics using an X-ray beam imaging (XBI) instrument based on the idea of recording radiation scattered from a thin foil of a low-Z material with a lensless camera are reported. The XBI instrument captures magnified images of the scattering region w...

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Detalhes bibliográficos
Main Authors: Kachatkou, Anton, Marchal, Julien, van Silfhout, Roelof
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2014
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3945420/
https://ncbi.nlm.nih.gov/pubmed/24562554
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577513034759
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