Reducing Interface Traps with High Density Hydrogen Treatment to Increase Passivated Emitter Rear Contact Cell Efficiency

In this work, a high-density hydrogen (HDH) treatment is proposed to reduce interface traps and enhance the efficiency of the passivated emitter rear contact (PERC) device. The hydrogen gas is compressed at pressure (~ 70 atm) and relatively low temperature (~ 200 °C) to reduce interface traps witho...

Descripción completa

Guardado en:
Detalles Bibliográficos
Publicado en:Nanoscale Res Lett
Autores principales: Yang, Chih-Cheng, Chen, Po-Hsun, Chang, Ting-Chang, Su, Wan-Ching, Chen, Sung-Yu, Liu, Shui-Chin, Chou, Sheng-Yao, Tan, Yung-Fang, Lin, Chun-Chu, Wu, Pei-Yu, Tsai, Tsung-Ming, Huang, Hui-Chun
Formato: Artigo
Lenguaje:Inglês
Publicado: Springer US 2019
Materias:
Nano Express
Acceso en línea:https://ncbi.nlm.nih.gov/pmc/articles/PMC6908542/
https://ncbi.nlm.nih.gov/pubmed/31832795
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-019-3216-3
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!

Ejemplares similares