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Carrier Depletion near the Grain Boundary of a SiC Bicrystal
Silicon carbide (SiC) bicrystals were prepared by diffusion bonding, and their grain boundary was observed using scanning transmission electron microscopy. The n-type electrical conductivity of a SiC single crystal was confirmed by scanning nonlinear dielectric microscopy (SNDM). Dopant profiling of...
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| Publicado en: | Sci Rep |
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| Main Authors: | , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Nature Publishing Group UK
2019
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6884474/ https://ncbi.nlm.nih.gov/pubmed/31784638 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-54525-z |
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