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X-ray diffraction data and analysis to support phase identification in FeSe and Fe(7)Se(8) epitaxial thin films
X-ray diffraction (XRD) data and analysis for epitaxial iron selenide thin films grown by pulsed laser deposition (PLD) are presented to support the conclusions in the related research article “Double epitaxy of tetragonal and hexagonal phases in the FeSe system” [1]. The films contain β-FeSe and Fe...
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| Publicado no: | Data Brief |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Elsevier
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6864172/ https://ncbi.nlm.nih.gov/pubmed/31763420 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.dib.2019.104778 |
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