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A Novel Measurement Method of Mechanical Properties for Individual Layers in Multilayered Thin Films
Various multilayered thin films are extensively used as the basic component of some micro-electro-mechanical systems, requiring an efficient measurement method for material parameters, such as Young’s modulus, residual stress, etc. This paper developed a novel measurement method to extract the Young...
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| Publicado no: | Micromachines (Basel) |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6843387/ https://ncbi.nlm.nih.gov/pubmed/31581644 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/mi10100669 |
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