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XPS and FTIR Studies of Polytetrafluoroethylene Thin Films Obtained by Physical Methods
Two methods—attenuated total reflection Fourier infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS)—have been used to analyze the chemical structure of polytetrafluorethylene (PTFE) thin coatings deposited by pulsed laser (PLD) and pulsed electron beam (PED) ablations. The vo...
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| 出版年: | Polymers (Basel) |
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| 主要な著者: | , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI
2019
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6835360/ https://ncbi.nlm.nih.gov/pubmed/31600899 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/polym11101629 |
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