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XPS and FTIR Studies of Polytetrafluoroethylene Thin Films Obtained by Physical Methods
Two methods—attenuated total reflection Fourier infrared spectroscopy (ATR-FTIR) and X-ray photoelectron spectroscopy (XPS)—have been used to analyze the chemical structure of polytetrafluorethylene (PTFE) thin coatings deposited by pulsed laser (PLD) and pulsed electron beam (PED) ablations. The vo...
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| Publicado no: | Polymers (Basel) |
|---|---|
| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6835360/ https://ncbi.nlm.nih.gov/pubmed/31600899 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/polym11101629 |
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