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SAD phasing of XFEL data depends critically on the error model
A nonlinear least-squares method for refining a parametric expression describing the estimated errors of reflection intensities in serial crystallographic (SX) data is presented. This approach, which is similar to that used in the rotation method of crystallographic data collection at synchrotrons,...
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| 出版年: | Acta Crystallogr D Struct Biol |
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| 主要な著者: | , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
International Union of Crystallography
2019
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6834081/ https://ncbi.nlm.nih.gov/pubmed/31692470 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2059798319012877 |
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