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Thickness Dependence of Ferroelectric and Optical Properties in Pb(Zr(0.53)Ti(0.47))O(3) Thin Films
As a promising functional material, ferroelectric Pb(Zr(x)Ti(1−x))O(3) (PZT) are widely used in many optical and electronic devices. Remarkably, as the film thickness decreases, the materials’ properties deviate gradually from those of solid materials. In this work, multilayered PZT thin films with...
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| Publicado no: | Sensors (Basel) |
|---|---|
| Main Authors: | , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6806319/ https://ncbi.nlm.nih.gov/pubmed/31547156 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s19194073 |
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