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CryoEM maps are full of potential
Electron microscopy is based on elastic scattering due to Coulomb forces between the incident electrons and the sample; thus, electron scattering is dependent on the charge distribution in the sample. Unlike atomic scattering factors for X-rays, electron scattering factors for some atoms are strongl...
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| Publicado no: | Curr Opin Struct Biol |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6778505/ https://ncbi.nlm.nih.gov/pubmed/31400843 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.sbi.2019.04.006 |
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