Probing Surface Morphology using X-ray Grating Interferometry

X-ray reflectometry (XRR), a surface-sensitive technique widely used for characterizing surfaces, buried interfaces, thin films, and multilayers, enables determination of the electron density distribution perpendicular to a well-defined surface specularly reflecting X-rays. However, the electron den...

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Bibliografiske detaljer
Udgivet i:Sci Rep
Main Authors: Yashiro, Wataru, Ikeda, Susumu, Wada, Yasuo, Totsu, Kentaro, Suzuki, Yoshio, Takeuchi, Akihisa
Format: Artigo
Sprog:Inglês
Udgivet: Nature Publishing Group UK 2019
Fag:
Article
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC6773752/
https://ncbi.nlm.nih.gov/pubmed/31575992
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-50486-5
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