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Probing Surface Morphology using X-ray Grating Interferometry
X-ray reflectometry (XRR), a surface-sensitive technique widely used for characterizing surfaces, buried interfaces, thin films, and multilayers, enables determination of the electron density distribution perpendicular to a well-defined surface specularly reflecting X-rays. However, the electron den...
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| Publicat a: | Sci Rep |
|---|---|
| Autors principals: | , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Publishing Group UK
2019
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6773752/ https://ncbi.nlm.nih.gov/pubmed/31575992 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-50486-5 |
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