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Resolution enhancement in scanning electron microscopy using deep learning
We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in low-resolution SEM images and comparing them with the accuratel...
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| 出版年: | Sci Rep |
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| 主要な著者: | , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group UK
2019
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6700066/ https://ncbi.nlm.nih.gov/pubmed/31427691 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-48444-2 |
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