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Resolution enhancement in scanning electron microscopy using deep learning
We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in low-resolution SEM images and comparing them with the accuratel...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6700066/ https://ncbi.nlm.nih.gov/pubmed/31427691 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-48444-2 |
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