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Clustered DNA Damages induced by 0.5 to 30 eV Electrons
Low-energy electrons (LEEs) of energies ≤30 eV are generated in large quantities by ionizing radiation. These electrons can damage DNA; particularly, they can induce the more detrimental clustered lesions in cells. This type of lesions, which are responsible for a large portion of the genotoxic stre...
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| Publicado no: | Int J Mol Sci |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6695612/ https://ncbi.nlm.nih.gov/pubmed/31370253 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ijms20153749 |
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