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InGaP electron spectrometer for high temperature environments

In this work, a 200 μm diameter InGaP (GaInP) p(+)-i-n(+) mesa photodiode was studied across the temperature range 100 °C to 20 °C for the development of a temperature-tolerant electron spectrometer. The depletion layer thickness of the InGaP device was 5 μm. The performance of the InGaP detector wa...

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Bibliografske podrobnosti
izdano v:Sci Rep
Main Authors: Butera, S., Lioliou, G., Zhao, S., Whitaker, M. D. C., Krysa, A. B., Barnett, A. M.
Format: Artigo
Jezik:Inglês
Izdano: Nature Publishing Group UK 2019
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC6668469/
https://ncbi.nlm.nih.gov/pubmed/31366906
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-47531-8
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