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Operando Analysis of Electron Devices Using Nanodiamond Thin Films Containing Nitrogen-Vacancy Centers
[Image: see text] Operando analysis of electron devices provides key information regarding their performance enhancement, reliability, thermal management, etc. For versatile operando analysis of devices, the nitrogen-vacancy (NV) centers in diamonds are potentially useful media owing to their excell...
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| Publicado no: | ACS Omega |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
American Chemical Society
2019
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| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6648530/ https://ncbi.nlm.nih.gov/pubmed/31459842 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsomega.9b00344 |
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