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Operando Analysis of Electron Devices Using Nanodiamond Thin Films Containing Nitrogen-Vacancy Centers
[Image: see text] Operando analysis of electron devices provides key information regarding their performance enhancement, reliability, thermal management, etc. For versatile operando analysis of devices, the nitrogen-vacancy (NV) centers in diamonds are potentially useful media owing to their excell...
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| Опубликовано в: : | ACS Omega |
|---|---|
| Главные авторы: | , , , , |
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
American Chemical Society
2019
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| Online-ссылка: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6648530/ https://ncbi.nlm.nih.gov/pubmed/31459842 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsomega.9b00344 |
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