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Rapid Evaluation of Electron Mobilities at Semiconductor–Insulator Interfaces in an Ambient Atmosphere by a Contactless Microwave-Based Technique
[Image: see text] Intrinsic mobility of electrons at the interfaces between crystalline organic semiconductors and insulating dielectric polymer films was rapidly evaluated in an ambient atmosphere by TRMC@Interfaces, a noncontact and nondestructive method based on dielectric loss spectroscopy of mi...
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| Publicado no: | ACS Omega |
|---|---|
| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
American Chemical Society
2017
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| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6640973/ https://ncbi.nlm.nih.gov/pubmed/31457218 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsomega.6b00428 |
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