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Evaluation of Intrinsic Charge Carrier Transport at Insulator-Semiconductor Interfaces Probed by a Non-Contact Microwave-Based Technique

We have successfully designed the geometry of the microwave cavity and the thin metal electrode, achieving resonance of the microwave cavity with the metal-insulator-semiconductor (MIS) device structure. This very simple MIS device operates in the cavity, where charge carriers are injected quantitat...

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Detalhes bibliográficos
Main Authors: Honsho, Yoshihito, Miyakai, Tomoyo, Sakurai, Tsuneaki, Saeki, Akinori, Seki, Shu
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group 2013
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3822380/
https://ncbi.nlm.nih.gov/pubmed/24212382
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep03182
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