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Back-irradiated and dual-screen sandwich detector configurations for radiography
Recent advances in thin film transistor array technology have enabled the possibility of “back-irradiated” (BI) indirect active-matrix flat-panel imagers (AMFPIs), in which x-rays first expose the scintillator through the optical sensor, and “dual-screen” AMFPIs, in which two scintillating screens a...
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| 發表在: | J Med Imaging (Bellingham) |
|---|---|
| Main Authors: | , , , |
| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
Society of Photo-Optical Instrumentation Engineers
2019
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| 主題: | |
| 在線閱讀: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6614698/ https://ncbi.nlm.nih.gov/pubmed/31312672 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/1.JMI.6.3.033501 |
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