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Back-irradiated and dual-screen sandwich detector configurations for radiography

Recent advances in thin film transistor array technology have enabled the possibility of “back-irradiated” (BI) indirect active-matrix flat-panel imagers (AMFPIs), in which x-rays first expose the scintillator through the optical sensor, and “dual-screen” AMFPIs, in which two scintillating screens a...

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Bibliografiska uppgifter
I publikationen:J Med Imaging (Bellingham)
Huvudupphovsmän: Lubinsky, Anthony R., Howansky, Adrian, Zheng, Hao, Zhao, Wei
Materialtyp: Artigo
Språk:Inglês
Publicerad: Society of Photo-Optical Instrumentation Engineers 2019
Ämnen:
Länkar:https://ncbi.nlm.nih.gov/pmc/articles/PMC6614698/
https://ncbi.nlm.nih.gov/pubmed/31312672
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1117/1.JMI.6.3.033501
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