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Thickness-Dependent Perovskite Octahedral Distortions at Heterointerfaces
[Image: see text] In this study, we analyze how the octahedral tilts and rotations of thin films of LaNiO(3) and LaAlO(3) grown on different substrates, determined using synchrotron X-ray diffraction-measured half-integer Bragg peaks, depend upon the total film thickness. We find a striking differen...
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| Vydáno v: | Nano Lett |
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| Hlavní autoři: | , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
American Chemical Society
2019
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| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6595436/ https://ncbi.nlm.nih.gov/pubmed/31117765 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.nanolett.9b01772 |
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