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Visualization of Polymer Crystallization by In Situ Combination of Atomic Force Microscopy and Fast Scanning Calorimetry

A chip-based fast scanning calorimeter (FSC) is used as a fast hot-stage in an atomic force microscope (AFM). This way, the morphology of materials with a resolution from micrometers to nanometers after fast thermal treatments becomes accessible. An FSC can treat the sample isothermally or at heatin...

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Bibliografske podrobnosti
izdano v:Polymers (Basel)
Main Authors: Zhang, Rui, Zhuravlev, Evgeny, Androsch, René, Schick, Christoph
Format: Artigo
Jezik:Inglês
Izdano: MDPI 2019
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC6572680/
https://ncbi.nlm.nih.gov/pubmed/31096647
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/polym11050890
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